MCVT405 CT/PT Analyser
1) Test signa: IEC60044-1, IEC60044-6, IEC60044-2, IEC60044-5, C57.13
2) Potentiae copia: AC220V±10%, 50/60Hz±10%
3) Intentionis / Current output: 0.1~ 180V (AC) / 0.001~5A(RMS)
5) Power output: 500VA
6) Maximum genu mensurae voltage: 45KV
VII) Current measurement
Range: 0~10A (automatice mutatio range in 0.1/0.4/2/10A)
Error: <±0.1%+0.01% FS
VIII) Mensurae intentione
Range: 0~200V (automatice variatio in 1V/10V/70V/200V)
Error: <±0.1%+0.01% FS
IX) Vertit ratio mensurae & erroris
Range: 1~35000
1~5000 (error<0.05%) & 5000~35000 (errore<0.1%)
10) Phase mensurae error: ±2min & resolutio: 0.01min
XI) resistentia curva mensura
Range: 0~8kΩ (automatice variatio in 2ohm/20ohm/80ohm/800ohm/8kohm)
Error: <0.2%RDG+0.02%FS
Maximi solutionis: 0.1mΩ
12) Mensurae Temperaturae: -50~ 100 Celsius gradus;Error <3 Celsius degree
13) CT Onus secundarium
Range: 0~160ohm (automatice mutatio range in 2ohm/20ohm/80ohm/160ohm)
Error: <0.2%RDG+0.02%FS
Maxima resolutio: 0.001ohm
14) PT Onus secundarium
Range: 0~80kohm (automatice mutatio range in 800ohm/8kohm/80kohm)
Error:<0.2%RDG+0.02%FS
Maximi senatus: 0.1ohm
15) PT ratio mensurae & erroris
Range: 1~35000
1~10000 (error<0.1%) & 10000~35000 (error<0.2%)
16) Error mensurae PT ratio: Error Typicus <0.05%, Maximus Error <0.1%
17) PT phase angulus mensurae: maximus error <3min
18) Aestimationem proventuum testium secundum signa electa
19) Fac verbum fama ad test eventus
20) Verbum refert unum tempus pro multi-coetibus test monumentis in PC
21) Rationem errorum calculate et errorum periodi rectus errorum apud aestimatos onerosos et onerosos in uno tempore test
22) Curvarum excitatio confer cum excitatione curvarum servatarum in eadem fenestra
23) Memoria capacitatis: >1000 circulorum testium eventus
24) Conditionem operans: temperies: -10℃~50℃;humidum: ≤90%
25) Size: 485mm×356mm×183mm
26) Pondus: <15kg